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Nanosystems Computer Aided Design @ UCLA
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Current Themes
Waferscale Integration
Machine Learning at the Edge
Opportunistic Memory Architecture and Resiliency
Design Technology Cooptimization
Past Themes
Hardware-Software Interface in Presence of Variability
Benchmarking and Robustness of Gate Sizing Heuristics
Design-Assisted Technology Scaling
Manufacturing-Aware Design
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Nanosystems Computer Aided Design @ UCLA
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Search for:
News
NanoCAD Group
Members
Support
Contact Information
Research
Publications
Thesis and Project Reports
Current Themes
Waferscale Integration
Machine Learning at the Edge
Opportunistic Memory Architecture and Resiliency
Design Technology Cooptimization
Past Themes
Hardware-Software Interface in Presence of Variability
Benchmarking and Robustness of Gate Sizing Heuristics
Design-Assisted Technology Scaling
Manufacturing-Aware Design
Press
Downloads
Teaching
Courses
Snippet Tutorials
UG and K-12 Outreach
Internal
NanoCAD Group
NanoCAD Group
Contact Information
Support
Members
