{"id":160,"date":"2019-10-02T21:06:17","date_gmt":"2019-10-02T21:06:17","guid":{"rendered":"http:\/\/nanocad.ee.ucla.edu\/?page_id=160"},"modified":"2019-10-09T04:57:27","modified_gmt":"2019-10-09T04:57:27","slug":"themes","status":"publish","type":"page","link":"https:\/\/nanocad.ee.ucla.edu\/?page_id=160","title":{"rendered":"Past Themes"},"content":{"rendered":"\nPast Themes<ul><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=266\" title=\"Machine Learning at the Edge\">Machine Learning at the Edge<\/a><\/li><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=263\" title=\"Opportunistic Memory Architecture and Resiliency\">Opportunistic Memory Architecture and Resiliency<\/a><\/li><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=261\" title=\"Waferscale Integration\">Waferscale Integration<\/a><\/li><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=168\" title=\"Hardware-Software Interface in Presence of Variability\">Hardware-Software Interface in Presence of Variability<\/a><\/li><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=166\" title=\"Manufacturing-Aware Design\">Manufacturing-Aware Design<\/a><\/li><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=164\" title=\"Benchmarking and Robustness of Gate Sizing Heuristics\">Benchmarking and Robustness of Gate Sizing Heuristics<\/a><\/li><li><a href=\"https:\/\/nanocad.ee.ucla.edu\/?page_id=162\" title=\"Design-Assisted Technology Scaling\">Design-Assisted Technology Scaling<\/a><\/li><\/ul>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":56,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-160","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/pages\/160","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=160"}],"version-history":[{"count":4,"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/pages\/160\/revisions"}],"predecessor-version":[{"id":302,"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/pages\/160\/revisions\/302"}],"up":[{"embeddable":true,"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=\/wp\/v2\/pages\/56"}],"wp:attachment":[{"href":"https:\/\/nanocad.ee.ucla.edu\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=160"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}